关于热敏电阻器几个常见可靠性实验的加速寿命实验实施办法  

Discussion on Methods of Accelerated Life Test for Several Common Reliability Tests of Thermistor

作　　者：周相国 ZHOU Xiang-guo(Shenzhen Sunlord Electronics Co.,Ltd.,Shenzhen 518110)

机构地区：[1]深圳顺络电子股份有限公司中心实验室,深圳518110

出　　处：《环境技术》2018年第4期63-65,共3页Environmental Technology

摘　　要：通过阿伦尼乌斯(Arrhe nius)模型、HAST实验标准、Coffin Manson模型确定高温类实验、湿热类实验、温度变化类实验的加速寿命实验原则,大幅缩短实验周期、提升产品可靠性评估效率、降低实验成本。This paper determined the accelerated life test principles of high temperature test, temperature and humidity test, temperature change test by using the Arrhenius model、HAST standards and Coffin Manson model,which may greatly shorten the test time、 improve product reliability evaluation efficiency and reduce the cost.

关 键 词：加速寿命实验 阿伦尼乌斯(Arrhenius)模型 Coffin Manson模型 HAST实验 

分 类 号：TN306[电子电信—物理电子学]