基于改进遗传算法的镀层氧化膜厚度测量研究  

Study on thickness measurement of coating oxide film based on improved genetic algorithm

作　　者：蒋广敏 戴利[2] 代欣[2] JIANG Guangmin;DAI Li;DAI Xin(Tengzhou Vocational Education Centre,Tengzhou 277500,China;Zaozhuang Vocational College of Science ＆ Technology,Zaozhuang 277500,China)

机构地区：[1]滕州市中等职业教育中心学校,山东枣庄277500 [2]枣庄科技职业学院,山东枣庄277500

出　　处：《周口师范学院学报》2018年第5期121-124,共4页Journal of Zhoukou Normal University

摘　　要：在镀层氧化膜厚度测量过程中,传统的图像处理镀层氧化膜厚度测量方法,由于镀层氧化膜较薄,采集图像的过程不易实现,存在得到的测试结果不准确、测试精度下降、抗干扰性差等问题.提出改进遗传算法的镀层氧化膜厚度测量方法,根据镀层氧化膜厚度的测量原理,结合传统镀层氧化膜厚度测量方法,构建遗传算法模型,并对遗传算法进行改进设计.通过改进的遗传算法模型,来求解镀层氧化膜厚度的最优值,该最优值即为所求的镀层氧化膜厚度.实验结果表明,改进遗传算法能够提高测量精度,并且有不易受外界环境干扰等优势.In the process of measuring the thickness of oxide film of coating, the traditional image processing method of measuring thickness of oxide film of coating, because of the thin oxide film of coating, the process of collecting image is not easy to realize, the result of measurement is not accurate, and the precision of measurement is decreased, and there are poor anti interference and other problems. An improved genetic algorithm （GA） method is proposed to measure the oxide film thickness of the coating. According to the measuring principle of the oxide film thickness of the coating, the genetic algo rithm model is constructed in combination with the traditional coating oxide film thickness measurement method, and the genetic algorithm is improved.Through the improved genetic algorithm model, the optimum value of oxide film thickness of coating is solved, which is the optimum value of oxide film of coating. The experimental results showed that the improved genetic algorithm can improve the measurement accuracy and is not easily affected by the external environment.

关 键 词：改进遗传算法 镀层氧化膜 厚度测量 外界干扰 

分 类 号：TP274[自动化与计算机技术—检测技术与自动化装置]