EM效应下众核处理器可靠性研究  

Research on Reliability of Many-core Processors under EM Effect

作　　者：张凌嘉 覃志东[1] 肖芳雄 ZHANG Lingfia;QIN Zhiclong;XIAO Fangxiong(School of Computer Science and Technology,Donghua University,Shanghai 201620,China;School of Software Engineering,Jinling Institute of Technology,Nanjing 211169,China)

机构地区：[1]东华大学计算机科学与技术学院,上海201620 [2]金陵科技学院软件工程学院,江苏南京211169

出　　处：《成都大学学报（自然科学版）》2018年第3期286-290,295,共6页Journal of Chengdu University（Natural Science Edition）

基　　金：国家自然科学基金(6126200);中央高校基本科研业务费专项基金(11D11209)资助项目

摘　　要：在EM效应下,以众核流程序为软件模型,建立了2D-Mesh结构众核处理器的可靠性模型.仿真研究表明:对于同一众核平台,当总体负载一定时,随着被分配任务核心的增加,单个任务周期内的处理器核心老化效应增大;当被绑定核心的数量一定时,核心在处理器上的位置越分散,核心的老化效应越低.研究的结论有利于高可靠众核系统的设计.The reliability model of 2D-Mesh many-core processors is established by taking the many-core dataflow software as the executing software model based on EM effect in this paper. Simulation results show that,when the overall load is fixed for the same many-core platform,the aging effect of processor cores in-creases with the increase in the number of the assigned task cores in a single task cycle;when the number of cores binding tasks is fixed,the more scattered the cores are on the processor, the lower the aging effect of the cores is. The research results in this paper are conducive to the design of the highly reliable many- core systems.

关 键 词：众核处理器 可靠性 流程序 EM效应 

分 类 号：TP302.7[自动化与计算机技术—计算机系统结构]