基于扫描隧道显微镜的原位表征技术  

STM based in situ techniques for physical characterizations

作　　者：姚钢 刘灿华 贾金锋 YAO Gang;LIU Can-hua;JIA Jin-feng(Key Laboratory of Artificial Structures and Quantmn Control（Ministry of Education）,Tsung-Dao Lee Institute,Physics and Astronomy,Shanghai Jiao Tong University,Shanghai 200240,China)

机构地区：[1]上海交通大学物理与天文学院人工结构及量子调控教育部重点实验室李政道研究所,上海200240

出　　处：《电子显微学报》2018年第5期408-413,共6页Journal of Chinese Electron Microscopy Society

基　　金：国家重点基础研究发展计划(Nos.2016YFA0301003;2016YFA0300403);国家自然科学基金资助项目(Nos.11521404;11634009;U1632102;11504230;11674222;11574202;11674226;11574201;U1632272;11655002);上海市科学技术委员会资助项目(No.16DZ2260200)

摘　　要：扫描隧道显微镜(scanning tunneling microscope, STM)是研究表面原子结构和表面电子态的强大工具,以STM为基础,作者发展了原位微区四探针电输运测量及交流互感抗磁测量系统,并且保留STM原有功能不受影响。这样,不仅能够在极低温、强磁场、超高真空的环境下用STM研究样品表面的晶体结构和电子态,也可以用原位微区四探针电输运测量来研究样品的输运特性,还可以用原位的交流互感抗磁测量来研究样品的抗磁特性。通过把这些信息对比,可以更好地了解样品物性与原子结构和电子结构的关系,准确地理解表面的物理性质。这种联合实验技术非常适合应用于低维及界面超导研究。Scanning tunneling microscope（STM） is themost powerful tool in studying atomic structure and surface states. Based on STM, we have succeeded in developing both in situ microscopic four-point probe（4 PP） transport measurement and two-coil mutual inductance techniques, while the original functionof STM remains unaffected.Thus, we can not only study the surface atomic structure and electronic states with STM in the environment of extremely low temperature, strong magnetic field and ultra-high vacuum, but also can study the transport properties by in situ micro-four-probe electric transport measurement, the diamagnetic properties by in-situ AC mutual inductance diamagnetic measurements. By comparing the information, we can better understand the relationship between sample physical properties and atomic, electronic structures. This joint experimental technique is very suitable for low dimensional and interface superconductivity research.

关 键 词：扫描隧道显微镜 原位 输运测量 交流互感 

分 类 号：TG115.215.7[金属学及工艺—物理冶金] TN116[金属学及工艺—金属学]