红外成像与CCD成像技术在四高炉炉顶的应用对比  

Application Comparison between Infrared and Charge-Coupled Device Imaging Technologies Used on Top of No.4 Blast Furnace

作　　者：罗伟 Luo Wei(Industrial Department of Ironmaking and Coking,Shougang Shuicheng Iron ＆ Steel（Group）Co.,Ltd.,Liupanshui 553028,Guizhou,China)

机构地区：[1]首钢水钢铁焦事业部,贵州六盘水553028

出　　处：《水钢科技》2018年第3期28-31,共4页Shuigang Science & Technology

摘　　要：通过在四高炉炉顶新增设红外成像仪技术的应用，分别介绍红外成像与CCD（可见光）成像新旧两种成像技术及测温的原理，就两种成像方式同时在高炉上的应用对比分析两种成像技术及测温方式的优劣，两种方式的价格成本高低，以及新技术对高炉生产的影响。An infrared imaging technique is newly used on top of No.4 blast furnace in Shuisteel. Both old and new imaging techniques （i.e., both infrared and charged-coupled deviee imaging techniques） and their temperature measurement prineiples are introduced. Advantages, disadvantages, costs and effects of two kinds of imaging and temperature measurement techniques used on top of the furnace are analyzed contrastively.

关 键 词：红外成像 CCD成像 十字测温 

分 类 号：TN215[电子电信—物理电子学]