Effect of Spectral Power Distribution on the Resolution Enhancement in Surface Plasmon Resonance  

作　　者：Cuixia ZHOU Guo XIA Guodong WANG Shiqun JIN 

机构地区：[1]Laboratory of Special Display Technology of the Ministry of Education, National Engineering Laboratory of SpecialDisplay Technology, National Key Laboratory of Advanced Display Technology, Academy of Photoelectric Technology,Hefei University of Technology, Hefei 230009, China

出　　处：《Photonic Sensors》2018年第4期310-319,共10页光子传感器（英文版）

摘　　要：For wavelength interrogation based surface plasmon resonance （SPR） sensors, refractive index （RI） resolution is an important parameter to evaluate the performance of the system. In this paper, we explore the influence of spectral power distribution on the refractive index （RI） resolution of the SPR system by simulating the reflectivity curve corresponding to different incident angles of the classical Kretschmann structure and several different spectral power distribution curves. A wavelength interrogation based SPR system is built, and commercial micro-spectrometers （USB2000 and USB4000） are used as the detection components, respectively. The RI resolutions of the SPR system in these two cases are measured, respectively. Both theoretical and experimental results show that the spectral power distribution has a significant effect on the RI resolution of the SPR system.For wavelength interrogation based surface plasmon resonance （SPR） sensors, refractive index （RI） resolution is an important parameter to evaluate the performance of the system. In this paper, we explore the influence of spectral power distribution on the refractive index （RI） resolution of the SPR system by simulating the reflectivity curve corresponding to different incident angles of the classical Kretschmann structure and several different spectral power distribution curves. A wavelength interrogation based SPR system is built, and commercial micro-spectrometers （USB2000 and USB4000） are used as the detection components, respectively. The RI resolutions of the SPR system in these two cases are measured, respectively. Both theoretical and experimental results show that the spectral power distribution has a significant effect on the RI resolution of the SPR system.

关 键 词：INSTRUMENTATION MEASUREMENT METROLOGY surface plasmon RESONANCE 

分 类 号：TP311[自动化与计算机技术—计算机软件与理论] TN244[自动化与计算机技术—计算机科学与技术]