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作 者:肖薇 张雷 XIAO Wei;ZHANG Lei(The 47th Institute of China Electronics Technology Group Corporation,Shenyang 110032,China)
机构地区:[1]中国电子科技集团公司第四十七研究所,沈阳110032
出 处:《微处理机》2018年第5期61-64,共4页Microprocessors
摘 要:根据某测温电路全温区-55℃~85℃误差测试需求,设计一套全温区自动测试系统。该系统采用上下位机方式,上位机采用C语言模块化编程技术,集中控制下位机的单片机及CPLD,结合测试设备共同操作,用模拟电压代替温度传感器输出电压,以此实现测温电路全温区升降温共计282个参数点的测温精度误差自动测试任务。测试系统具有一键式操作功能,界面简洁明了,可实现全温区自动化测试,并在测试结束后自动生成测试报表,保存测温曲线。经生产测试验证表明所设计系统实时性好、可靠性高,能够保证测试的一致性,并同时大幅提高生产效率。According to the error test requirement of a temperature measuring circuit in the fulltemperature range of -55C85C, an automatic test system in the full temperature range is designed. Thesystem adopts the mode of upper and lower computer with the upper computer using the C languagemodular programming technology to control the single chip microcomputer and CPLD of the lowercomputer centrally, combines the test equipment to operate together, and replaces the output voltage ofthe temperature sensor with analog voltage, thus realizing the automatic test task of temperaturemeasurement accuracy error of 282 parameter points in the whole temperature range of the temperaturemeasuring circuit. The test system has a one-button operation function and a simple and clear interface,which can realize automatic test in the full temperature range, automatically generate test reports andsave temperature measurement curves after the test is finished. The production test shows that thedesigned system has good real-time performance and high reliability, can ensure the consistency of thetest and greatly improve the production efficiency.
关 键 词:测温电路 ADC技术 高精度 自动测试 模块化编程技术 指令与数据交互
分 类 号:TP273.5[自动化与计算机技术—检测技术与自动化装置]
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