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作 者:朱爱军[1,2] 陈端勇 胡聪 许川佩[1,2] Zhu Aijun;Chen Duanyong;Hu Cong;Xu Chuanpei(School of Electronic Engineering and Automation,Guilin University of Electronic Technology,Guilin 541004,China;Guangxi Key Laboratory of Automatic Detecting Technology and Instruments,Guilin 541004,China)
机构地区:[1]桂林电子科技大学电子工程与自动化学院,桂林541004 [2]广西自动检测技术与仪器重点实验室,桂林541004
出 处:《电子测量技术》2018年第17期15-19,共5页Electronic Measurement Technology
基 金:国家自然科学基金(61561012);国家留学基金(201508455020);广西自动检测技术与仪器重点实验室基金(YQ16110);广西自然科学基金(2017GXNSFAA198021);广西中青年教师基础能力提升项目(2017KY0210)资助
摘 要:由于纳米制造的特征尺寸不断缩小,自组装被认为是纳米制造与计算的新兴学科与技术。但是,随着复杂系统自组装过程中出现了多种现象,导致最终的自组装模式出现故障。针对对称瓦片现象产生的自组装故障问题,研究了自组装中对称瓦片对二进制计数器性能影响,通过分析对称类型与对称瓦片的位置,建立了对称瓦片与二进制计数之间的确切关系。Xgrow仿真结果表明分析的有效性和正确性。Self-assembly is regarded as a new subject and technology for nano manufacturing and computing because of the shrinking feature size of nano manufacturing.However,there are many phenomena in the process of self assembly of complex systems,resulting in the failure of the final self-assembly pattern.Based on the self assembly of binary counter tile,effects of symmetric tiles are studied,through the analysis of s symmetry type tile position.The exact relationship between the tile and the symmetry of binary counting is established.Simulation results which are obtained by Xgrow demonstrate that the analysis is valid and correct.
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