A novel BIST scheme for circuit aging measurement of aerospace chips  被引量:3

A novel BIST scheme for circuit aging measurement of aerospace chips

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作  者:Huaguo LIANG Xiangsheng FANG Maoxiang YI Zhengfeng HUANG Yingchun LU 

机构地区:[1]Studio of Computer Architecture, Hefei University of Technology, Hefei 230009, China [2]Anhui Institute of Economic Management, Hefei 230051, China

出  处:《Chinese Journal of Aeronautics》2018年第7期1594-1601,共8页中国航空学报(英文版)

基  金:supported by the National Natural Science Foundation of China (Nos.61674048,61574052,61474036,61371025);Project Team of Anhui Institute of Economics and Management of China (No.YJKT1417T01)

摘  要:The avionics working environment is bad, easy to accelerate aging of circuits. Circuit aging is one of the important factors that influence the reliability of avionics, so circuit aging testing is of great significance to improve the reliability of avionics. As continuing aging would degrade circuit performance, aging can be monitored through precise measurement of performance degradation. However, previous methods for predicting circuit performance have limited prediction accuracy. In this paper, we propose a novel Built-In Self-Test(BIST) scheme for circuit aging measurement, which constructs self-oscillation loops employing parts of critical paths and activates oscillations by specific test patterns. An aging signature counter is then used to capture the oscillation frequency and in turn measure the aging state of the circuit. We propose to implement this measurement process by BIST. Experimental results show that the proposed in-field aging measurement is robust with respect to process variations and can achieve a precision of about 90%. The application of this scheme has a certain value to improve the reliability of avionics systems.The avionics working environment is bad, easy to accelerate aging of circuits. Circuit aging is one of the important factors that influence the reliability of avionics, so circuit aging testing is of great significance to improve the reliability of avionics. As continuing aging would degrade circuit performance, aging can be monitored through precise measurement of performance degradation. However, previous methods for predicting circuit performance have limited prediction accuracy. In this paper, we propose a novel Built-In Self-Test(BIST) scheme for circuit aging measurement, which constructs self-oscillation loops employing parts of critical paths and activates oscillations by specific test patterns. An aging signature counter is then used to capture the oscillation frequency and in turn measure the aging state of the circuit. We propose to implement this measurement process by BIST. Experimental results show that the proposed in-field aging measurement is robust with respect to process variations and can achieve a precision of about 90%. The application of this scheme has a certain value to improve the reliability of avionics systems.

关 键 词:Aging measurement AVIONICS BIST Critical path Self-oscillation loops 

分 类 号:V243[航空宇航科学与技术—飞行器设计]

 

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