ICTSSE: An Object-Oriented IC Test Software Supporting Environment  

作　　者：孙育宁 王晓明 时万春 

机构地区：[1]InstituteofComputingTechnology,TheChineseAcademyofSciences,Beijing100080

出　　处：《Journal of Computer Science & Technology》1995年第5期447-454,共8页计算机科学技术学报（英文版）

摘　　要：An IC test software supporting environment-ICTSSE, which supports the migration and simulation of test 'pattern programs on heterogeneous ATEs, is presented. ICTSSE is a subsystem of Test Developmellt System (TeDS). It has the capabilities of verifying the IC's stimulus/response vectors and associated timing resources against the target ATE. The general data interchange format,which is the center of the TeDS, is built for test pattern migration.An IC test software supporting environment-ICTSSE, which supports the migration and simulation of test 'pattern programs on heterogeneous ATEs, is presented. ICTSSE is a subsystem of Test Developmellt System (TeDS). It has the capabilities of verifying the IC's stimulus/response vectors and associated timing resources against the target ATE. The general data interchange format,which is the center of the TeDS, is built for test pattern migration.

关 键 词：CAT object-oriented paradigm data interchanging format 

分 类 号：TN402[电子电信—微电子学与固体电子学] TP311.52[自动化与计算机技术—计算机软件与理论]