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出 处:《电子学报》1964年第4期98-104,共7页Acta Electronica Sinica
摘 要:本文叙述了几种薄膜电阻器的材料和对瓷体表面的一般要求。测试了基体的高温绝缘电阻特性;研究了不同基体对三种薄膜电阻器负荷寿命的影响。金属膜电阻器的试验指出:直流负荷时,开始阻值变化呈半永久性,薄膜的电化学腐蚀破坏是逐渐的、比较长期的。这一过程与试验条件有关:当降低比负荷功率时可以减缓这一效应;基体中鉀、钠含量不同,这一效应有显著差别。 文中指出了改善薄膜电阻器直流老化性能的一些可能措施。根据新、老瓷体电阻器的负荷寿命对比的结果,作者认为有效的措施是:采用以碱士金属氧化物为助熔剂的陶瓷基体。Several film-resistor materials and the general requirements for the surface of the substrate are described. The insulation resistance of the substrates at high temperature were measured. The effects of various subsrates upon the load lives of the three kinds of film resistors were investigated. It has been pointed out from the tests of the metal film resistor that the initial changes of the resistance were semi-permanent on D.C. load and the electrochemical corrosion of the films was gradual and relatively long. This effect had much to do with the test conditions and could be slowed down by derating. The different contents of Na+ and k+ in the substrate showed quite different effect.This paper presents some possible methods for improving the D. C. aging performance of film resistors. By comparing the load lives of the newer and older substrates it is considered to be very effective to add alkali-earth metal oxides as the flux for the ceramic substrate.
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