VG354质谱计离子源电离带低温测量设备及其应用  

A Devices for Measuring Low Temperature of Filament in Ion Source of VG 354 Thermal IonizationMass Spectrometer and Its Application

作　　者：肖应凯[1] 魏海珍[1] 王庆忠[1] 张崇耿[1] 孙爱德[1] 

机构地区：[1]中国科学院青海盐湖研究所,西宁810008

出　　处：《分析化学》2002年第10期1272-1276,共5页Chinese Journal of Analytical Chemistry

基　　金：中国科学院大型仪器改造项目 (No .2 0 0 0 2 16)

摘　　要：设计了一种用于VG 35 4型热电离质谱计电离带低温测量装置 (DWZZ)。它由热电偶温度计及连接件组装而成 ,能即时测定电离带的表面温度。测定的离子源中电离带的低温段温度与加热电流的关系可用关系式y =-ax3+bx2 -cx +d表示 ,温度测定的误差 <± 2℃。此装置已用于石墨非还原热离子发射特性和石墨存在下M2 BO+2 、M2 X+A device was designed to measure low temperature of filament in ion source of VG 354 thermal ionization mass spectrometry by assembling thermocouple thermometer and connector. This device can he used to measure instantly temperature on the surface of single filament in ion source. The functional correlation between the measured temperature of filament and the heating current through the filament was characterized by aft equation of y = -ax(3) + bx(2) - cx + d. The error of measured temperature is less than +/- 2 degreesC. The device was also applied to study the characteristics of non-reductive thermal ion emission of graphite in thermal ionization mass spectrometry and to study mechanism of M2BO2+ and M2X+ emission in the presence of graphite.

关 键 词：VG354质谱计 离子源 电离带 低温测量设备 应用 热离子发射 温度测量 

分 类 号：TH843[机械工程—仪器科学与技术]