低能离子注入引起的植物种子微结构的变化  

THE CHANGE IN MICROSTRUCTURE OF PLANT SEEDS INDUCED BY LOW ENERGY ION IMPLANTATION

作　　者：陆挺[1] 

机构地区：[1]北京师范大学低能核物理研究所

出　　处：《物理》2002年第9期555-557,共3页Physics

基　　金：国家自然科学基金 (批准号 :19890 3 0 3 )资助重大项目

摘　　要：以植物干种子芸豆和花生为生物体材料 ,采用正电子湮没技术 (PAT)测定了该两类生物样品的正电子湮没寿命谱 (PAL) .测量结果表明 ,在芸豆和花生生物体内存在着大量微小的孔洞 ,孔洞的直径分别为 0 4 8nm和0 7nm .植物种子的这类特殊的微孔结构是低能离子注入生物效应机理的基础 .对注入 2 0 0keV低能V离子的花生样品也测量了它的PAL谱 ,并与未经离子注入的花生样品的PAL谱作了比较 .Positron lifetime measurements were performed on biological samples of lima bean and peanut. The experimental results showed that there were many small holes of diameter 0\^48nm and 0\^7nm, respectively, in the lima bean and peanut samples. The very special micro\|hole structure of plant seed is the basis of biological effects caused by ion implantation of low energy. The peanut seeds were implanted with vanadium at an energy of 200keV. The positron annihilation lifetime(PAL) spectra of implanted and non\|implanted peanut samples were compared.

关 键 词：低能离子注入 微结构 正电子湮没 植物种子 离子注入生物效应机理 辐射育种 

分 类 号：Q947[生物学—植物学]