光学综合孔径干涉成像技术  

Optical synthesis aperture interference image technology

作　　者：王海涛[1] 周必方[1] 

机构地区：[1]国家天文台南京天文光学技术研究所,江苏南京210042

出　　处：《光学精密工程》2002年第5期434-442,共9页Optics and Precision Engineering

基　　金：中国科学院重点项目基金 ;86 3基金资助课题

摘　　要：闭合相位技术、U_V覆盖技术和像重构技术是光学综合孔径干涉成像的三个关键技术。文中详细介绍了闭合相位技术的原理、U_V覆盖技术 (包括即时覆盖和通过孔径旋转的非即时覆盖两种方法 )和用于图像重构的常用方法以及用于光学综合孔径像重构的混合迭代方法 ,最后讨论了光学综合孔径干涉成像技术的应用。Closure phase technology, U-V coverage technology and image reconstruction technology are three key technologies for optical synthesis aperture image. This paper details the closure phase theory, U-V coverage technology (which contains real time cover and non real time cover through aperture rotation) and the common method for image reconstruction, as well as the hybrid method for optical synthesis aperture image. The applications of optical synthesis aperture interference image technology are discussed in the end.

关 键 词：光干涉 光学综合孔径 图像重构 闭合相位 U-V覆盖 光学成像 

分 类 号：O436.1[机械工程—光学工程]