低压差线性稳压器瞬时电离辐射试验方法  

Transient ionizing radiation effects for experimental method of LDO

作　　者：杨力宏[1] 姚和平[1] 刘智[1] 赵光炜 刘娜[1] 时应璇 YANG Lihong;YAO Heping;LIU Zhi;ZHAO Guangwei;LIU Na;SHI Yingxuan(Integrated Circuit Design Department,Xi’an Institute of Microelectronics Technology, Xi’an Shaanxi 710065,China)

机构地区：[1]西安微电子技术研究所集成电路设计事业部,陕西西安710065

出　　处：《太赫兹科学与电子信息学报》2017年第1期129-133,共5页Journal of Terahertz Science and Electronic Information Technology

基　　金：装备预先研究资助项目(51311050301)

摘　　要：在核爆环境下,要求低压差线性稳压器(LDO)的输出电压能够快速恢复。本文定性分析了瞬时电离辐射后LDO的输出电压恢复时间与负载电阻的关系;在"强光一号"加速器上开展了相应的瞬时电离辐射效应试验研究。对比分析不同负载条件下的输出电压恢复时间,发现两者密切相关,通过合理调整输出负载电阻值,可以有效地减小瞬时电离辐射后电路的恢复时间。辐射试验结果表明,经过瞬时电离剂量率为1.0×10^(11 rad(Si)/s辐照后,采用适当负载的LDO的输出电压恢复时间可小于100μs。In the nuclear explosion environment, it is required that the output voltage of Low Dropout Regulator(LDO) can recover quickly. The relationship between the output voltage recovery time and the load resistance after the instantaneous ionizing radiation has been qualitatively analyzed. The experimental study is carried out on the effects of instantaneous ionizing radiation based on the “Qiang–guang-I”accelerator. The close relationship is found exiting between the output voltage recovery time and the load resistance by analyzing many experimental results. The recovery time of the circuit can be effectively reduced by adjusting the load resistance value which is tested by the instantaneous ionizing radiation experiment. The test results show that LDO output voltage recovery time decreases to 100 μs after the instantaneous ionizing radiation of 1.0×1011 rad(Si)/s.

关 键 词：低压差线性稳压器 瞬时电离辐射效应 恢复时间 

分 类 号：TM44[电气工程—电器]