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作 者:Gou Jie Zhang Chonghong Song Yin Yang Yitao Ding Zhaonan Yi Xiaoyan Xie Haizhong Yang Hua Wang Hongmei Wang Xiaozhi
机构地区:[1]Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730070, China [2]Institute of Semicoductors, Chinese Academy of Sciences, Lanzhou 730070, China
出 处:《IMP & HIRFL Annual Report》2015年第1期126-127,共2页中国科学院近代物理研究所和兰州重离子研究装置年报(英文版)
摘 要:The lifetime of light-emitting diodes (LED) becomes a more important concern because of the increasing application of LED in the field of traffic light, solid-state light and color displays[1]. A life time test of a light source usually requires several thousand hours to ensure the successful application of LED in higher reliability and performance.
关 键 词:FE ION IRRADIATED
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