质量控制图在直读光谱分析高纯银中的应用  

Application of quality control chart in analysis of high purity silver by direct reading spectrometer

作　　者：张元璋[1] 方名戌[1] 吴嵩[1] 虞婧[1] Zhang Yuanzhang;Fang Mingxü;Wu Song;Yü Jing(Shanghai Institute of Measurement and Testing Technology)

机构地区：[1]上海市计量测试技术研究院

出　　处：《上海计量测试》2017年第4期28-30,共3页Shanghai Measurement and Testing

摘　　要：以测定高纯银杂质中铜、铅、硒含量的直读光谱分析数据为例,通过平均值、极差、上下控制限及中心线的计算,绘制了-R质量控制图,该图可有效验证直读光谱仪器的稳定性,确保检测结果可控准确。In this paper,based on the example of determination of impurity element(copper,lead,selenium)in high purity silver by direct reading spectrometer,X-R quality control chart was drawed by the calculation of accumulated experiment data including test average,range,upper and lower control limits,center line.The chart can effectively judge the stability of the direct reading spectrometer,to ensure the accuracy and controllability of the test result.

关 键 词：质量控制图 直读光谱 高纯银 

分 类 号：TG115.33[金属学及工艺—物理冶金] TG146.32[金属学及工艺—金属学]