Dynamic imaging of metallic contamination plume based on self-potential data  

基于自然电场监测的金属污染物动态成像（英文）

作　　者：Yi-an CUI Xiao-xiong ZHU Wen-sheng WEI Jian-xin LIU Tie-gang TONG 崔益安;朱肖雄;魏文胜;柳建新;佟铁钢(中南大学地球科学与信息物理学院,长沙410083;中南大学有色资源与地质灾害探查湖南省重点实验室,长沙410083;中南大学教育部有色金属成矿预测重点实验室,长沙410083)

机构地区：[1]School of Geosciences and Info-Physics, Central South University, Changsha 410083, China [2]Hunan Key Laboratory of Non-ferrous Resources and Geological Hazard Detection,Central South University, Changsha 410083, China [3]Key Laboratory of Metallogenic Prediction of Nonferrous Metals, Ministry of Education,Central South University, Changsha 410083, China

出　　处：《Transactions of Nonferrous Metals Society of China》2017年第8期1822-1830,共9页中国有色金属学报（英文版）

基　　金：Project(41574123) supported by the National Natural Science Foundation of China;Project(2013FY110800) supported by the National Basic Research Scientific Program of China

摘　　要：A dynamic imaging method for monitoring self-potential data was proposed.Based on the Darcy’s law and Archie’sformulas,a dynamic model was built as a state model to simulate the transportation of metallic ions in porous medium,and theNernst equation was used to calculate the redox potential of metallic ions for observation modeling.Then,the state model andobservation model form an extended Kalman filter cycle to perform dynamic imaging.The noise added synthetic data imaging testshows that the extended Kalman filter can effectively fuse the model evolution and observed self-potential data.The further sandboxmonitoring experiment also demonstrates that the self-potential can be used to monitor the activities of metallic ions and exactlyretrieve the dynamic process of metallic contamination.提出了自然电场数据的动态成像方法。基于达西定律和阿尔奇公式,构建模拟孔隙介质中金属离子运动的动态模型。采用能斯特方程计算金属离子的氧化还原电位。在此基础上建立自然电场监测金属离子活动的状态模型和观测模型,利用扩展卡尔曼滤波技术对金属离子活动过程进行动态成像。模拟数据测试结果表明,该方法能有效将金属离子运动模型与自然电场观测数据融合,实现动态成像。进一步沙箱监测实验表明,自然电场法可以有效监测金属离子污染,利用动态成像方法可以有效重构金属离子的扩散过程。

关 键 词：dynamic imaging SELF-POTENTIAL metallic contamination extended Kalman filter 

分 类 号：O657.1[理学—分析化学] X830[理学—化学]