微带铁氧体器件测试夹具LRL校准与设计  

LRL calibration and design of test fixture for microstrip ferrite devices

作　　者：韩晓川 闫欢[1] 胡艺缤 杨洋 HAN Xiao-chuan;YAN Huan;HU Yi-bin;YANG Yang(Ninth Research Institute, China Electronic Technology Group Corporation, Mianyang 621000, China)

机构地区：[1]中国电子科技集团公司第九研究所,四川绵阳621000

出　　处：《磁性材料及器件》2017年第5期40-43,共4页Journal of Magnetic Materials and Devices

摘　　要：对于传统微波无源器件S参数的测量,通常是先在矢量网络分析仪上对同轴端进行SOLT的全二口校准,再通过测试夹具对微带器件进行测试,测试夹具引入了一定的测试误差。为实现微带双端口器件的准确测试,设计了用于LRL校准方法的测试夹具及校准件。介绍了校准原理及校准件设计,通过HFSS仿真软件对测试夹具进行仿真优化,设计制作了LRL精确校准的测试夹具及校准件。对X波段微带器件进行测试,验证LRL测试夹具测试的准确性。The S-parameters of the traditional microwave passive devices are usually calibrated on the two-port of the SOLT in the vector network analyzer,and then microstrip device is tested by test fixture,which results in some test error.In order to realize accurate measurement for the microstrip dual port device,test fixture and calibration device for the LRL calibration method was designed.The calibration principle and calibration device design was introduced,and the test fixture was simulated and optimized by simulation software.The accurate calibration of test fixtures and calibration device for the LRL calibration were obtained.Test on X-band microstrip devices verifies the accuracy of the test fixture.

关 键 词：微带铁氧体器件 LRL校准 测试夹具 

分 类 号：TN60[电子电信—电路与系统]