Stylus deformation calibration and scale value extraction of REVO five-axis measuring system  

REVO五轴测量系统探针变形量标定及光栅值提取（英文）

作　　者：ZHANG Hai-tao LIU Shu-gui SU Zhi-kun LI Xing-hua 张海涛;李杏华;刘书桂;苏智琨(天津大学精密测试技术及仪器国家重点实验室,天津300072;天津大学机械工程学院,天津300072)

机构地区：[1]State Key Laboratory of Precision Measuring Technology and Instruments,Tianjin University ,Tianjin 300072, China [2]School of Mechanical Engineering, Tianjin University , Tianjin 300072, China

出　　处：《Journal of Measurement Science and Instrumentation》2017年第3期223-227,共5页测试科学与仪器（英文版）

基　　金：National Natural Science Foundation of China(No.51375338)

摘　　要：REVO?is a dynamic measuring head and probe system,which is designed and applied in orthogonal coordinatemeasuring machines(CMMs)to maximize measurement throughput whilst maintaining high system accuracy.A calibration approachto the stylus deformation of REVO head is proposed and the scale value of each CMM axis is separated from the limiteddata returned from the measuring system according to the application of REVO head in non-orthogonal CMM.Experimentsshow that the calibration method presented and extraction of scale value are of effectiveness and correctness.Results demonstratethat the maximum measurement error has decreased from0.2021mm to0.0009mm and the variation of scale value ofeach CMM axis is two orders lower after the stylus deformation is compensated.

关 键 词：REVO head CALIBRATION stylus deformation scale value extraction 

分 类 号：TH72[机械工程—仪器科学与技术]