短路波导法测试低损耗透波材料高温复介电常数  

Complex Permittivity Measurement of Low Loss Dielectric Material for High Temperature by Short Waveguide Method

作　　者：徐银芳[1] 邹样辉[1] 李恩[2] 张喦 王依超[2] Xu Yin-fang;Zou Yang-hui;Li En;Zhang Yan;Wang Yi-chao(Beijing Institute of Space Long March Vehicle, Beijing, 100076;University of Electronic Science and Technology, Chengdu, 610054)

机构地区：[1]北京航天长征飞行器研究所,北京100076 [2]电子科技大学,成都610054

出　　处：《导弹与航天运载技术》2017年第5期103-106,共4页Missiles and Space Vehicles

摘　　要：针对透波材料的高温复介电常数测试问题,概述了短路波导法测试低损耗透波材料复介电常数的原理;对高温测试波导的选材与设计进行了分析;对电磁窗常用的几种透波材料的高温复介电常数进行了测试。结果表明:此系统可以从室温到1600℃对透波材料的复介电常数进行精确测量。Research on the measurement of low loss dielectric material for high temperature,the principle of complex permittivitymeasurement of low loss dielectric material for high temperature by short wave-guide method is summarized,material selection anddesign of high temperature waveguide is analyzed,the high temperature complex permittivity of low loss dielectric materials appliedon some random and antenna window material is measured.The results were satisfactory and the temperature could measure accuratelyfrom room temperature to1600℃.

关 键 词：透波材料 短路波导法 高温测试 复介电常数 

分 类 号：V414[航空宇航科学与技术—航空宇航推进理论与工程]