可编程性扫描式集成测量头调理电路设计  

Programmable Integrated Scanning Probe Conditioning Circuit Design

作　　者：吴昱桦 王科健 WU Yuhua;WANG Kejian(Department of Mechanical and Electrical Engineering,Baiyin Vocational and Technical College of Mining and Metallurgy,Baiyin 730900,China)

机构地区：[1]白银矿冶职业技术学院机电工程系,甘肃白银730900

出　　处：《电子科技》2018年第1期75-78,共4页Electronic Science and Technology

摘　　要：针对扫描式LVDT电感式集成测量头噪音大、测量精度底等问题。文中采用了一种可编程性且灵活性高的扫描式LVDT电感式集成测量头调理电路,其使用同步解调器和模拟滤波器ADA2200在模拟域中提取位置信息和抑制模拟电路噪声,通过内部集成的高速、16位高精度A/D转换器以及其他功能模块的单片机C8051F060对调理电路进行可编程控制和数据采集读取。对所开发电路进行了测试和实验,实验结果达到了预期要求。Based on a large scanning LVDT inductive probe integrated noise shortcomings,the measurement accuracy of the end,this paper presents a high flexibility and programmability of scanning integrated inductive LVDT probe conditioning circuit.The use of synchronous demodulator and ADA2200analog filter in the analog domain to extract the location information and suppress noise analog circuits,MCU through the internal integration of high-speed,high-precision16-bit A/D converters,and other functional modules of C8051F060conditioning circuit programmable control and data acquisition read.Finally,the development of the circuit has been tested and experimental results achieved expectations.

关 键 词：测量头 调理电路 可编程控制 数据采集读取 测试实验 

分 类 号：TN79[电子电信—电路与系统]