ATE系统在卫星导航射频芯片测试技术中的应用  

Application of Ate System in Satellite Navigation RF Chip Testing Technology

作　　者：叶鑫 戴志春 伍俊 曹马健 张勇虎 YE Xin;DAI Zhi-chun;WU Jun;CAO Ma-jian;ZHANG Yong-hu(Guizhou Machinery and Electronic Products Quality Supervision and Inspection Institute,Guiyang Guizhou 550081;Hunan Satellite Information Technology Co.,ltd,Changsha Hunan 410000)

机构地区：[1]贵州省机械电子产品质量监督检验院,贵州贵阳550081 [2]湖南卫导信息科技有限公司,湖南长沙410000

出　　处：《数字技术与应用》2018年第1期65-66,共2页Digital Technology & Application

摘　　要：在导航系统中,卫星导航射频芯片是一个重要的组成部分,芯片的质量优劣能够决定导航系统的导航精度。本文通过对卫星导航射频芯片结构特点的分析,对芯片的主要参数进行了分析测试。在基于集成电路自动测试系统的基础之上,结合射频测试设备对卫星导航射频芯片的性能进行了测试。这个方案对于卫星导航射频芯片的测试研究有着重要的意义。In the navigation system,the satellite navigation radio frequency chip is an important part,the quality of the chip can determine the navigation accuracy of the navigation system.In this paper,through the analysis of the structure characteristics of the satellite navigation RF chip,the main parameters of the chip are analyzed and tested.Based on the integrated circuit automatic test system,the performance of the satellite navigation RF chip is tested with the RF test equipment.This scheme is of great significance for the test and research of satellite navigation RF chip.

关 键 词：集成电路测试 卫星导航射频芯片 应用 

分 类 号：TP311.52[自动化与计算机技术—计算机软件与理论]