基于TD-LTE UE侧随机接入过程的研究与分析  

Research and Analysis of TD-LTE Random Access Process by the UE Side

作　　者：彭迪 何健 PENG Di;HE Jian(Wuhan Research Institution of Posts and Telecommunications,Wuhan 430072;Wuhan Hongxu Information Technology Co.,LTD.,Wuhan 430205)

机构地区：[1]武汉邮电科学研究院,武汉430072 [2]武汉虹旭信息技术有限责任公司,武汉430205

出　　处：《舰船电子工程》2018年第3期62-67,共6页Ship Electronic Engineering

摘　　要：随机接入过程是LTE系统中必不可少的一个环节,高效快速的随机接入过程对于提高LTE的整体性能具有重要意义。基于TD-LTE系统,从UE的角度对随机接入过程中物理层以及高层协议栈的关键技术和实现细节进行了研究,对提高UE在TD-LTE系统中,随机接入过程的实现效率有很大的帮助和参考意义。As random access process is an essential part of LTE system,efficient and fast random access process is of great importance to improve the overall performance of LTE system.Based on the TD-LTE system,it studied the key technologies and implementation details of the physical layer and the high level protocol stack in the random access process by the UE side.It is very helpful to improve the efficiency of TD-LTE random access process by the UE side.

关 键 词：随机接入 前导码 PRACH信道 竞争解决 

分 类 号：TN919.3[电子电信—通信与信息系统]