基于半导体制冷元件的新型湿度测量器  

The Design and Fabrication of a New Type Humidity Measuring Device Based on Semiconductor Refrigeration

作　　者：张芫睿 董国波[1] 汪海涛 熊畅[1] 李英姿[1] 刁训刚[1] 李华[1] ZHANG Yuan-rui;DONG Guo-bo;WANG Hai-tao;XIONG Chang;LI Ying-zi;DIAO Xun-gang;LI Hua(Beihang University,Beijing 100191)

机构地区：[1]北京航空航天大学,北京100191

出　　处：《大学物理实验》2018年第1期1-5,共5页Physical Experiment of College

基　　金：北京市自然科学基金资助项目(2161001);北京航空航天大学重大;重点教改项目

摘　　要：在探索新型湿度测量原理,利用温差、湿度与水蒸气液化速率的关系制作一个能够形成恒定温差的装置,进一步通过测量温差和恒定温差表面的水分含量得到空气的湿度。设定一个环境湿度的标定值作为对照,衡量自制湿度器所得结果的可靠性。The aim is to explore a new theory of humidity measuring.Based on the relations among difference in temperature,humidity and the rate of water vapor’s liquefaction,the new device can be designed with a constant difference in temperature,and then the value of humidity is able to be obtained by measuring the temperature difference as well as the moisture content of a certain surface with a constant difference in temperature.Moreover,a standard humidity value is necessary to be set as a scientific control in order to conveniently evaluate the reliability of the result generated by the new device.

关 键 词：半导体制冷片 单片机 湿度测量器 恒定温差 

分 类 号：O4-33[理学—物理]