数字图像处理技术在扫描电化学显微镜中的应用  

Application of Digital Image Processing Technology in Scanning Electrochemical Microscope

作　　者：王伟[1,2] 刘振邦[2] 包宇 关怡然[2] 牛利 张国玉[1] WANG Wei;LIU Zhen-Bang;BAO Yu;GUAN Yi-Ran;NIU Li;ZHANG Guo-Yu(The School of Photo-Electronic Engineering,Changchun University of Science and Technology,Changchun 130022,China;Changchun Institute of Applied Chemistry,Chinese Academy of Sciences,Changchun 130022,China;Center for Advanced Analyticl Science,C/O School of Chemistry and Chemical Engineering,Guangzhou University,Guangzhou 510006,China)

机构地区：[1]长春理工大学光电工程学院,长春130022 [2]中国科学院长春应用化学研究所,长春130022 [3]广州大学化学化工学院分析科学技术研究中心,广州510006

出　　处：《分析化学》2018年第3期342-347,共6页Chinese Journal of Analytical Chemistry

基　　金：国家自然科学基金项目(Nos.21527806;21405147)资助~~

摘　　要：扫描电化学显微镜(SECM)使用超微电极作为探针,由于发生在探针电极上的氧化还原反应是一个扩散过程,探针电极在快速移动过程中会对扩散过程产生影响,导致SECM图像变得不清晰。本研究采用Lo G算法与NEDI插值算法相结合的图像处理技术对获得的SECM图像进行处理,Lo G算法可以提高SECM图像的清晰度,但会导致图像中部分边缘信息丢失,利用基于边缘导向插值的NEDI算法对后续图像进行处理,可以很好地解决这个问题。采用离子溅射方法制备了金叉指电极和金点阵电极两种基底,对金叉指电极基底、金点阵电极基底和印有指纹的ITO基底进行了SECM成像,通过对3种基底的SECM原始图像、Lo G变换后的图像和NEDI插值后的图像进行比较分析,表明Lo G算法与NEDI插值算法结合在一起的图像处理技术可以明显提高SECM图像的清晰度和分辨率。Ultramicroelectrode was usually used in scanning electrochemical microscope(SECM)as a probe.The redox reaction on the probe is a diffusion process.But the fast moving of probe in SECM will affect the diffusion process,resulting in unclear obtained images.A new SECM image-processing technique was proposed in this paper involving combination of LoG algorithm and New edge-directed interpolation(NEDI)interpolation algorithm.LoG algorithm is helpful for the clarity of SECM images,but leading to some loss of edge information.Fortunately,NEDI algorithm based on edge directed interpolation can solve this problem well.Two substrates with gold interdigitated electrode and gold electrode array were prepared by ion sputtering method.The SECM images were obtained of the gold interdigitated electrode,gold electrode array and ITO substrate printed with fingerprints.The corresponding images treated by LoG filter and these for NEDI interpolation were compared and analyzed.The image-processing technique combining the LoG algorithm with the NEDI interpolation algorithm can significantly improve the clarity and resolution of SECM image.

关 键 词：扫描电化学显微镜 图像处理 LOG算法 NEDI插值 

分 类 号：TH742[机械工程—光学工程] TP391.41[机械工程—仪器科学与技术]