微米级颗粒透射电子显微镜样品的简单制备方法  

Simple preparation method for TEM specimens of micro-grade particles

作　　者：马秀梅[1] 尤力平[1] MA Xiu-mei;YOU Li-ping(Electron Microscopy Laboratory,School of Physics,Peking University,Beijing 100871,China)

机构地区：[1]北京大学物理学院,电子显微镜实验室,北京100871

出　　处：《电子显微学报》2018年第2期201-204,共4页Journal of Chinese Electron Microscopy Society

摘　　要：针对微米级颗粒透射电镜样品,本文详细介绍了一种操作简单、实用性强的制备方法。TEM表征结果表明,采用该方法可以成功制备出微米级颗粒的适合TEM观察的样品。Aiming at the transmission electron microscope(TEM)specimens of micro-grade particles,a preparation method with a simple operation and a high practicality was introduced.The TEM results indicated that by using this method it could succeed in preparing TEM specimens for micro-grade particles.

关 键 词：透射电镜 微米颗粒 制样 离子减薄 

分 类 号：O766.1[理学—晶体学] TG115.215.3[金属学及工艺—物理冶金]