电化学腐蚀法制备STM探针针尖的探究  

Preparing STM probe using electrochemical corrosion method

作　　者：刘升光[1] 李浥晨 姜程予 牟宗信[1] 李雪春[1] LIU Sheng-guang;LI Yi-chen;JIANG Cheng-yu;MU Zong-xin;LI Xue-chun(National Demonstration Center for Experimental Physics Education,Dalian University of Technology,Dalian 116024,China)

机构地区：[1]大连理工大学基础物理国家级实验教学示范中心,辽宁大连116024

出　　处：《物理实验》2018年第4期20-23,共4页Physics Experimentation

基　　金：大连理工大学大学生创新创业项目(No.2017101411100010844)

摘　　要：利用电化学腐蚀法腐蚀高纯钨丝制备了扫描隧道显微镜探针,研究了腐蚀电压、溶液浓度对探针针尖质量的影响.总结出实验室条件下制备探针针尖的最优化条件为:电源电压为18V,NaOH溶液浓度为1mol/L.The electrochemical corrosion method was used to corrode high purity tungsten wire to prepare the probe for scanning tunneling microscope.The effects of corrosion voltage and solution concentration on the quality of the probe were studied.With experimental data and image analysis,the optimized conditions for preparing the probe were obtained,the power supply voltage was 18 V and NaOH concentration was 1 mol/L.

关 键 词：扫描探针 钨丝 NAOH溶液 电化学腐蚀 

分 类 号：O646.6[理学—物理化学]