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作 者:宿军 王劲松[1] 李延风[1] 刘斯尧 SU Jun;WANG Jinsong;LI Yanfeng;LIU Siyao(School of Optoelectronic Engineering,Changchun University of Science and Technolony,Changchun 130022)
出 处:《长春理工大学学报(自然科学版)》2018年第2期80-82,共3页Journal of Changchun University of Science and Technology(Natural Science Edition)
基 金:吉林省科技支撑计划重大专项(No.KYC-JC-YM-2012-081)
摘 要:红外热像仪各项性能的检测离不开红外成像系统性能测试设备,测试系统的校正对于性能参数的检测和修正至关重要。针对红外热像仪性能参数检测系统的参数检测需求,进行了系统校正方法的研究。设计完成了校正系统,利用物理温差与辐射温差的关系,测量得到一系列的温度分布曲线。采用最小二乘方法对测试数据进行线性拟合,完成了测试系统校正系数的标定。实验结果表明,该方法解决了检测系统校正的技术问题。满足标定测试要求。对于红外热像仪性能参数检测系统的应用具有重要的实用价值和意义。The performance testing of infrared thermal imager is essential for the performance testing equipment.The calibration of the testing system is very important to the detection and correction of the performance parameters.In this paper,the correction method was discussed for the parameter detection requirements of infrared thermal imager parameter testing system.The calibration system was designed and completed.Using the relation between physical temperature difference and radiation temperature difference,a series of temperature distribution curves were obtained.The calibration of the calibration coefficient was obtained by using the least square method to carry out the linear fitting of the test data.This method solved the technical problem of calibration and accorded with the requirements of calibration.It has important practical value and significance for the application of infrared thermal imager performance parameter testing system.
分 类 号:TN216[电子电信—物理电子学]
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