红外焦平面探测器成像中的重影现象  

Double image in the infrared imaging with focal plane array

作　　者：李娟[1] 冯帅 马静[1] 刘兴新[1] LI Juan;FENG Shuai;MA Jing;LIU Xing-xin(North China Research Institute of Electro-Optics,Beijing 100015,China)

机构地区：[1]华北光电技术研究所,北京100015

出　　处：《激光与红外》2018年第4期493-496,共4页Laser & Infrared

摘　　要：在一款256×256中波红外探测器成像中,发现了成像重影,这种重影严重影响图像质量。特别是探测微弱目标时,对目标的识别和捕获会产生严重的干扰。本文介绍了专用红外焦平面点源实验平台,对成像重影的数据特性进行了分析,并通过机理分析和实验比较定位了引起成像重影的原因。成像重影是由于测试电路阻抗不匹配及带宽不够造成的,通过改进测试电路消除了这种重影。There appears the double image phenomenon in a kind of medium-wave 256 x256 infrared focal plane ar-ray detector imaging,and it seriously affects the image quality.The special experiment platform of IRFPA point source was introduced,and the data characteristics of the double image were analyzed.The causes of the double image were found through mechanism analysis and experiments.The mismatch of impedance and the lack of bandwidth of the test circuit lead to the formation of double image.The double image phenomenon can be eliminated by improving the per-formance of the test circuit.

关 键 词：红外焦平面阵列 成像重影 测试电路 

分 类 号：TN214[电子电信—物理电子学]