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作 者:刘永丽 宋炜哲 李进 安九华 尹萍 Liu Yongli;Song Weizhe;Li Jin;An Jiuhua;Yin Ping(Xi'an UnilC Semiconductors Co.,Ltd.,Xi'an Shaanxi 710075,China)
机构地区:[1]西安紫光国芯半导体有限公司,陕西西安710075
出 处:《信息与电脑》2018年第6期37-39,共3页Information & Computer
摘 要:LPDDR4是新一代高频率、高容量、低功耗的DRAM存储器,其国际JEDEC标准于2014年公布。笔者基于LPDDR4国际JEDEC标准提出了一种DRAM产品的随机验证算法RANDOMP,该算法突破了传统手写验证算法的局限。通过RANDOMP可以生成符合JEDEC标准的合法随机操作序列,序列对产品进行随机操作,高效模拟了各类复杂应用场景,及早发现设计缺陷,实现了对LPDDR4产品的全面、高效验证。LPDDR4 DRAM memory which has faster speed and higher density,consumes much lower power consumption.JEDEC releases LPDDR4 standard for low power memory devices in 2014.Based on this standard,a random pattern verification algorithm named RANDOMP is realized in this paper.It overcomes the drawbacks of simple pattern which are unitary and limited,and need repetitive work.RANDOMP generates random pattern to operate LPDDR4 DRAM product randomly but always obey the rules of JEDEC standard.This random but legal access to DRAM products simulates as complex as many real applications.RANDOMP is developed aimed to verify functionality of LPDDR4 product systematically and efficiently,tons of random patterns generated by RANDOMP to simulate and test the LPDDR4 product to find design defect as early as possible.
关 键 词:LPDDR4 JEDEC 随机验证算法 RANDOMP 设计缺陷
分 类 号:TP391.41[自动化与计算机技术—计算机应用技术]
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