基于V型谐振腔的热稳定性分析  

Analysis of thermal stability based on V-type folded cavity

作　　者：范一鸣[1] 魏勇[1] 张戈[2] 李宏民[1] 陶家友[1] 周岳平 FAN Yiming;WEI Yong;ZHANG Ge;LI Hongming;TAO Jiayou;ZHOU Yueping(School of Physics and Electronics,Hunan Institute of Science and Technology,Yueyang 414006,China;Key Laboratory of Optoelectronic Materials Chemistry and Physics,Fujian Institute of Research on the Structure of Matter,Chinese Academy of Sciences,Fuzhou 350002,China;Yueyang Main Land Laser Technology Co.Ltd.,Yueyang 414000,China)

机构地区：[1]湖南理工学院物理与电子学院,岳阳414006 [2]中国科学院福建物质结构研究所光电材料化学与物理重点实验室,福州350002 [3]岳阳大陆激光技术有限公司,岳阳414000

出　　处：《激光技术》2018年第2期206-211,共6页Laser Technology

基　　金：国家自然科学基金资助项目(21427801);湖南省教育厅资助项目(17B112)

摘　　要：为了提高V型谐振腔的热稳定性,采用了图解分析法,将V型折叠腔等效为腔内含有一个透镜的共轴球面腔。同时考虑到晶体热透镜效应,结合多元件光学谐振腔的等价腔分析法,将等效后腔内含透镜组的多元件球面腔近似等价为腔内不含透镜的共轴球面空腔。对V型腔等价后的共轴球面空腔的稳定性进行了理论计算和仿真分析。结果表明,当总腔长为75mm、折叠角为0.15π左右时,谐振腔具有最宽的热稳定范围;此时若增益介质与折叠镜的间距为28mm,则谐振腔能适应的最小热透镜焦距可达12mm。这一结果体现了谐振腔关键参量对热稳定性的重要影响,对激光腔型稳定性的优化设计具有一定的指导意义。In order to improve the thermal stability of V-type resonant cavity,based on graphic analysis,a simple V-type folded cavity was transformed into a coaxial spherical cavity with a thin lens.At the same time,considering the thermal effect of lens and combining with equivalent cavity analysis method of multi element optical resonator,the V-type folded cavity with lens group was transformed into a coaxial spherical cavity with no lens in the cavity.And the thermal stability of coaxial spherical cavity with no lens was calculated and analyzed.The results show that,the cavity has the widest range of thermal stability when the total cavity is 75mm and the fold angle is 0.15π.When the interval between the gain medium and folding mirror is 28mm,the focal length of the minimum thermal lens being suitable for the cavity can reach 12mm.The study shows that the key parameters of the cavity are important to thermal stability,and it has guiding significance for the optimization design of laser cavity stability.

关 键 词：光学设计 V型折叠腔 等价腔分析法 腔稳定性 

分 类 号：TN202[电子电信—物理电子学] TN248.1