倾斜式生长Alq_3薄膜及其光学性能的表征  

Characterization of Tilted Growth of Alq_3 Films and Their Optical Properties

作　　者：敏乾 刘子恒 MIN Qian;LIU Zi-heng(Department of Physics and Hydropower Engineering,Gansu Normal University for Nationalities, Hezuo Gansu 747000)

机构地区：[1]甘肃民族师范学院物理与水电工程系,甘肃合作747000

出　　处：《甘肃高师学报》2018年第2期32-35,共4页Journal of Gansu Normal Colleges

基　　金：甘肃省高等学校科研项目"甘肃南部地区野生苦菜叶绿素含量与色彩参数的相关性研究"(2015B-123)

摘　　要：利用实验室已有的倾斜式生长装置,制备出了具有不同微纳结构的Alq_3(喹啉铝)薄膜.对制备的不同微纳结构Alq_3薄膜的形貌及晶体结构进行了表征与分析,分析了入射角度对薄膜微纳结构的影响及其机理,分析了薄膜倾斜式生长的动力学过程.结果表明:当入射粒子流与衬底法线的夹角为80°,获得了柱状结构的Alq_3薄膜,且薄膜有沿(111)晶像择优生长的具有闪锌矿立方相的晶体结构;当倾斜角为0°时,则形成了连续致密结构的薄膜,且薄膜有沿(222)晶像择优生长的具有闪锌矿结构.Using the existing tilted growth device of the laboratory,we prepare the Alq3 film with different micro-nano structures,and characterized and analyzed its morphology and crystal structure,then the influence and mechanism of incident angle on the microstructure and the dynamic process of thin film tilting growth are analyzed.The results show that:when the incidence angle among incident particle flow and substrate is 80 degrees,we obtained the Alq3 film with columnar structure,and the film has sphalerite cubic crystal structure along(111)crystal orientation preferential growth;when the tilt angle is 0 degree,it forms thin film with continuous dense structure,and the film has sphalerite cubic crystal structure along(222)crystal orientation preferential growth.

关 键 词：倾斜式生长 Alq3有机纳米薄膜 电致发光 

分 类 号：O484.1[理学—固体物理]