4-20 STM Study of HOPG Irradiated by Highly Charged Ions  

作　　者：Zeng Jian Yao Huijun Zhai Pengfei Zhang Shengxia Hu Peipei Duan Jinglai Mo Dan Hou Mingdong Sun Youmei Liu Jie 

机构地区：[1]不详

出　　处：《IMP & HIRFL Annual Report》2016年第1期133-135,共3页中国科学院近代物理研究所和兰州重离子研究装置年报（英文版）

摘　　要：Highly oriented pyrolytic graphite(HOPG)was irradiated by highly charged ions(84Kr^19+,84Kr^20+)at large fluence range(1.2×10^11 to 3.1×10^16 ions/cm^2).The variation of the HOPG surface with the increasing fluence was investigated by STM.The STM images of HOPG sample irradiated by Kr19+ions with different fluence are shown in Fig.1(a)^(g),and a number of hillocks can be found on the irradiated HOPG samples.

分 类 号：O4[理学—物理]