下一代光传输系统中超高速ADC芯片性能测试方法  

Test Method of Ultra-High Speed ADC Performance in Next Generation Optical Transmission System

作　　者：菅端端[1] 钟明琛[1] JIAN Duan-duan;ZHONG Ming-chen(China Electronics Standardization Institute,Beijing 100176,China)

机构地区：[1]中国电子技术标准化研究院,北京100176

出　　处：《电子学报》2018年第9期2251-2255,共5页Acta Electronica Sinica

摘　　要：针对下一代光传输系统对模数转换器(ADC)高采样率、大带宽的要求,提出一种针对该类ADC动态性能的测试方法.通过分析光传输系统中ADC芯片的特点,解决了采样时钟无法直接测量,输出数据难以捕获,分辨率不易统计,插损非线性导致带宽测量偏差等问题,并将该方法应用于光传输、雷达、卫星等高数据率场景所用超高速ADC芯片的评测中.测试结果表明,该方法解决了最高采样率70GSPS带宽16GHz的超高速ADC测试的关键问题,基本满足下一代400Gbps光传输系统对ADC动态性能测试的要求.This paper presents a set of test methods of analog to digital converter(ADC)dynamic performance,which are used for ADC with high sample rate and large bandwidth in next generation optical transmission system.Based on the analysis of the characteristics of ADC in optical transmission,the following essential problems are solved,including measuring the frequency of sampling clock directly,gathering the output data,calculating the resolution,and correcting the nonlinear error of bandwidth testing.The methods are used in performance evaluation on ultra-high speed ADCs,which are used for high data rate applications,such as optical transmission,radar,satellite,etc.Based on the test results,these methods have solved the key problem of 70GSPS sampling rate 16GHz bandwidth high speed ADC,which can meet the requirement of ADC dynamic performance test used in next generation 400Gbps optical transmission.

关 键 词：超高速模数转换器 下一代光传输系统 增益补偿 插损消除 

分 类 号：TN06[电子电信—物理电子学]