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作 者:饶衍冰 Rao Yan-bing(National Quality Supervision and Testing Center for Low-voltage Switching Device(Fujian),Fujian Fuzhou 350002)
机构地区:[1]国家低压开关电器产品质量监督检验中心(福建),福建福州350002
出 处:《电子质量》2018年第7期12-14,共3页Electronics Quality
摘 要:该文通过对低压电器短路试验中常用的功率因数测量方法进行了介绍分析,并结合该试验站50k A试验室功率因数测量对比,确定了适合该试验室的功率因数测量方法,进一步方便了该试验站50k A通断系统功率因数测量方法的选取,方便了短路试验的参数调节。In this paper,the power factor measurement method used in the short circuit test of low voltage electrical apparatus is introduced and analyzed.Combined with the comparison of the power factor measurement of 50kA test room of this test station,the power factor measurement method suitable for the test room is determined,which is convenient for the selection of the power factor measurement method of the 50kA conne ction system in this test station,and it is convenient to facilitate the selection of the power factor measurement method of the test station.The parameters of the short circuit test are adjusted.
分 类 号:TM93[电气工程—电力电子与电力传动]
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