关于差模和共模干扰的研究  

Research on differential mode and common mode interference

作　　者：张宏 邹凤华[2] Zhang Hong;Zou Fenghua(Army Armored Force Academy non commissioned officer school,Changchun Jilin,130017;College of computer science and technology,Changchun University,Changchun Jilin,130022)

机构地区：[1]陆军装甲兵学院士官学校,吉林长春130017 [2]长春大学计算机科学技术学院,吉林长春130022

出　　处：《电子测试》2018年第14期49-49,51,共2页Electronic Test

摘　　要：本文介绍了干扰的分类和产生方式,对于共模干扰和差模干扰详细的说明了产生的各种情况,重点阐述了各种干扰的测量方式及其在电路中如何加以克服和防范。This paper introduces the classification and generation of interference,describes the common mode interference and differential mode interference in detail,and focuses on how to measure all kinds of interference and how to overcome and prevent it in the circuit.

关 键 词：差模干扰 共模干扰 共模抑制比 共阻抗耦合 

分 类 号：TN972[电子电信—信号与信息处理]