强流负氢离子源发射度测量仪研制  

Development of Emittance Scanner for High Intensity H-Ion Source

作　　者：管锋平[1] 温立鹏[1] 宋国芳[1] 贾先禄[1] GUAN Fengping;WEN Lipeng;SONG Guofang;JIA Xianlu(China Institute of Atomic Energy,P.O.Box 275-3,Beijing 102413,China)

机构地区：[1]中国原子能科学研究院回旋加速器研究设计中心,北京102413

出　　处：《原子能科学技术》2018年第10期1911-1915,共5页Atomic Energy Science and Technology

基　　金：国家自然科学基金资助项目(11075222)

摘　　要：在加速器技术研究中,束流发射度是反映束流品质的重要物理参数,也是加速器和束流传输线设计的重要依据。100MeV回旋加速器采用18mA强流负氢离子源来产生负氢束,为了准确测量离子源的发射度,研制了一台强流负氢离子源发射度测量仪,介绍了其基本原理、机械设计和实验结果,得到了离子源的发射度信息,为100MeV回旋加速器的设计提供了发射度参数。The emittance is an important parameter of the ion source,reflecting the quality of the beam.The emittance is also the starting point for the design of accelerator and beam line.The CYCIAE-100 cyclotron uses an 18 mA high intensity ion source to produce H-ion beam.One type of emittance scanner for high intensity H-ion beam was designed in order to get the precise measure of the ion source emittance.The working principle,mechanical design and experiment results were introduced,and the emittance of H-ion source was gotten.The measurement results can be used for the design of the CYCIAE-100 cyclotron.

关 键 词：强流 离子源 发射度 束流诊断 

分 类 号：TL542.1[核科学技术—核技术及应用]