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作 者:刘东海[1] 郭慧玉 文丰[1] 李秋媛 LIU Donghai;GUO Huiyu;WEN Feng;LI Qiuyuan(Key Laboratory of Instrumentation Science and Dynamic Measurement,Ministry of Education;Science and Technology on Electronic Test and Measurement Laboratory,North University of China,Taiyuan 030051,China)
机构地区:[1]中北大学仪器科学与动态测试教育部重点实验室,电子测试技术重点实验室,太原030051
出 处:《电子器件》2018年第5期1247-1251,共5页Chinese Journal of Electron Devices
摘 要:针对传统等效器无法等效存储器数据接口种类繁多,传输速率及传输帧格式有所差异等问题,研制了一种通用型存储器等效测试卡。将Hotlink接口、RS-485/RS-422接口和LVDS长线接口等使用频率相对较高的接口集成到一张测试卡上。上位机软件可以通过PXI接口对等效测试卡的各项参数进行配置如传输接口、传输速率及帧格式等。此外,还能对测试卡记录的数据进行事后读取并分析。该设计将传统的存储器转变成等效测试卡的形式,相对较大的提升了等效器的实用性。通过大量试验证明,该测试卡在不同配置方案下均能有效的实现存储器地等效功能。A common type of memory equivalent test card has been developed for the traditional equivalents of the equivalent memory data interface,the transmission rate and the transmission frame format.The Hotlink interface,RS-485/RS-422 interface and LVDS long-term interface.Those interfaces are used frequently relatively high,are integrated into a single test card.PC software can be configured through the PXI interface equivalent parameters of the test card configuration such as transmission interface,transmission rate and frame format.In addition,the data recorded on the test card can be read and analyzed later.The design of the traditional memory into an equivalent test card in the form of a relatively large increase in the practicality of the equivalent.Through a large number of experiments show that the test card in a different configuration program can effectively achieve the equivalent function of the memory.
分 类 号:TP274[自动化与计算机技术—检测技术与自动化装置]
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