电子产品低温试验中的防凝露技术  

Condensation Prevention Technology of Electronics Product in Low Temperature Test

作　　者：刘继承[1] LIU Ji-cheng(The 14th Research Institute of China Electronics Technology Group Corporation, Nanjing 210039)

机构地区：[1]中国电子科技集团公司第十四研究所,南京210039

出　　处：《环境技术》2018年第6期7-10,15,共5页Environmental Technology

摘　　要：本文介绍了一种电子产品低温试验防凝露技术。在试验过程中,用干燥的氮气置换出试验箱内的潮湿空气,显著降低箱内空气的露点温度;在允许的情况下,通过降低试验的升温速率或采用步进式升温,解决由试品热惯性导致的试品升温速度滞后于空气升温速度的问题,确保试品的温度高于箱内空气的露点温度,从而避免试品的凝露。某星载产品的试验结果表明,该方法可有效防止低温试验过程中试品的凝露,具有方法简单、通用性强的特点。An electronics product condensation prevention method is introduced.In low temperature test,the dew point of air inside the chamber can be significantly reduced by replacing the humid air with dry nitrogen.If permitted,the problem that the temperature rising rate of the specimen under test is lower than that of air can be solved by reducing the temperature changing rate or adopting step by step temperature rising strategy,therefor condensation on the surface of specimen can be avoided.Tests results show that the method can prevent the condensation of the test specimen effectively and could be used easily and widely.

关 键 词：凝露 预防 空气置换 

分 类 号：TP23[自动化与计算机技术—检测技术与自动化装置]