非同轴微波器件测试夹具设计方法研究与探讨  

Research and Discussion on Design Methed for Test Fixture of Non-coaxial Microwave Devices

作　　者：程婷婷[1] 张一治[1] 任翔[1] 李静[1] 李硕[1] 苗志坤[1] CHENG Tingting;ZHANG Yizhi;REN Xiang;LI Jing;LI Shuo;MIAO Zhikun(Aerospace Science and Industry Denfense Technology Research Testing Center,Beijing 100854)

机构地区：[1]航天科工防御技术研究试验中心,北京100854

出　　处：《计算机与数字工程》2019年第1期65-69,共5页Computer & Digital Engineering

摘　　要：论文根据非同轴微波器件的测试原理,提出非同轴微波器件的难点是测试夹具的设计,介绍了设计非同轴微波器件测试夹具的设计方法,包括结构设计方法和电路设计方法两个方面。文章还提出要实现非同轴微波器件的准确测试,需要对夹具实现校准,并且介绍了夹具校准的四种方法来实现对夹具的校准,包括端口延伸法、夹具上校准法、利用时间域和时间门功能的方法和去嵌入处理法。最后文章总结了非同轴微波器件夹具合理设计具有的意义。In this paper,the test principle of non-coaxial microwave devices is developed.In this paper,the difficulty of testing the non-coaxial microwave devices is the design of test fixture.This paper introduces the design method of test fixture of non-coaxial microwave devices,including structure design method and circuit design method.It is not enough to realize the accurate test of non-coaxial microwave devices.So this paper introduces the method of fixture calibration to realize the calibration fixture,including the port extention method,the fixture upper calibration method,the method of time domain and time gate function,and De-embedding treatment method.Finally,this paper summarizes the significance of the rational design of non-coaxial microwave devices.

关 键 词：非同轴 微波器件 测试 夹具 

分 类 号：TN63[电子电信—电路与系统]