基于阿雷尼乌斯模型开展的加速寿命试验激活能研究  

Research on the Activation Energy of Accelerated Life Testing Based on Arrhenius Model

作　　者：吴兆希 韩晓东 朱恒静 白璐[1] WU Zhao-xi;HAN Xiao-dong;ZHU Heng-jing;BAI Lu(The 24th Research Institute of CETC,Chongqing 400060;Material Department of China Academy of Space Technology,Beijing 100086)

机构地区：[1]中国电子科技集团公司第二十四研究所,重庆400060 [2]航天五院物资部,北京100086

出　　处：《环境技术》2019年第1期30-33,共4页Environmental Technology

摘　　要：目前"长寿命"已成为航空航天产品的通用要求,而整个系统的长寿命很大程度上取决于电子产品的寿命,Arrhenius模型是使用最为广泛的用于预计电子产品寿命的加速寿命试验方法之一。而在使用Arrhenius模型时,激活能一般都参照美军标中的参考值取0.5～0.7eV,该数值表征产品的失效机理。本文基于国内90年代建成的某模拟集成电路生产线生产的一款运算放大器,通过多组试验数据,拟合计算其激活能Ea,并用相同试验方法拟合出基于同一生产线的AD转换器、驱动器的激活能Ea,通过对比得出激活能Ea与哪些因素相关。Nowadays the “long lifetime” has been a general demand for aerospace products which was largely determained by the condition of electric products in the whole system. Arrheniusmodel is one of the most popular methods which are used to predict the lifetime of electric products. The Ea-activity energy in Arrhenius model is always assumed as 0.5~0.7 eV according to American MilitaryStandard which means failure mechanism. This article researched Ea in the Arrhenius model based on a type of Operational Amplifiers which were made in the line that set up in 1990s. From several groups of data for AD Conversion and Operational Amplifiers and Driver, Ea was calculated and relevant factors are given.

关 键 词：模拟集成电路 阿雷尼乌斯模型 激活能 

分 类 号：TB114.3[理学—概率论与数理统计]