一起断路器断口电容介损异常的分析  被引量:1

Analysis of Abnormal Dielectric Loss of Capacitor across Open Contacts of Circuit Breaker

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作  者:戚科孙 刘春涛 黄学民 欧阳聪 鲍超斌 夏秋 QI Kesun;LIU Chuntao;HUANG Xuemin;OUYANG Cong;BAO Chaobin;XIA Qiu(Guangzhou Bureau of China Southern Power Grid Ultra-high Voltage Transmission Companies,Guangzhou 510000,China;Wuhan Zheng Zhong Heyuan Electronic Technology Co.,Ltd.,Wuhan 430000,China)

机构地区:[1]南方电网超高压输电公司广州局,广东广州510000 [2]武汉启亦电气有限公司,湖北武汉430000

出  处:《电工技术》2019年第5期130-131,133,共3页Electric Engineering

摘  要:首先介绍超高压输电公司广州局多断口断路器断口间并联电容器介损异常的总体情况,然后对一起断路器端口电容介损的异常情况进行原因分析。采用高压介损的方法对该断路器三相母线侧和CT侧测试值与上次试验值分别进行了比较,得出其发生了Garton效应,从而引起了试验值异常的结论,并且说明了母线侧电容器比CT侧电容器介损更大的原因。最后给出设备改进意见。The general situation of the abnormal dielectric loss of shunt capacitors across open contacts of multi-break circuit breakers in Guangzhou UHV Transmission Company was introduced. The causes of an abnormal dielectric loss of capacitors at the end of circuit breakers discovered recently was analyzed. The Garton effect of the three-phase bus-side and CT-side of the circuit breaker was obtained by comparing the measured value with the last test value through the method of high voltage dielectric loss,which caused the abnormal test value. The reason why the dielectric loss of the bus-side capacitor was greater than that of the CT-side capacitor was explained in detail. Finally,suggestions for improvement of equipment were given.

关 键 词:多断口 断路器 介质损耗 母线侧 CT侧 

分 类 号:TN93[电子电信—信号与信息处理]

 

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