基于FTA的磁共振成像设备可靠性研究  

Reliability study of magnetic resonance imaging equipment

作　　者：贾琳[1] 王红[1] 易凯婷 秦东旭 时松和[2] 程敬亮[3] 张贺伟 罕迦尔别克.库锟 翟树佳 贾文霄 JIA Lin;WANG Hong;YI Kaiting;QIN Dongxu;SHI Songhe;CHENG jingliang;ZHANG Hewei;Hanjiaerbieke Kukun;ZHAI Shujia;JIA Wenxiao(Department of Radiology,The Second Affiliated Hospital,Xinjiang Medical University,Urumqi 830063,China,The First Affiliated Hospital,Zhengzhou University,Zhengzhou 450000,China;School of Public Health, The First Affiliated Hospital, Zhengzhou University, Zhengzhou 450000, China;Department of Radiology,The First Affiliated Hospital,Zhengzhou University,Zhengzhou 450000,China;Zhengzhou Xinyihua Medical Technology Co.,LTD.,Zhengzhou 450000,China;Xinjiang Medical University,Urumqi 830011,China;Image Center,The First Affiliated Hospital,Xinjiang Medical University,Urumqi 830054,China)

机构地区：[1]新疆医科大学第二附属医院影像科,乌鲁木齐830063 [2]郑州大学公共卫生学院,郑州450000 [3]郑州大学第一附属医院影像科,郑州450000 [4]郑州新益华医学科技有限公司,郑州450000 [5]新疆医科大学,乌鲁木齐830011 [6]新疆医科大学第一附属医院影像中心,乌鲁木齐830054

出　　处：《新疆医科大学学报》2019年第3期336-340,共5页Journal of Xinjiang Medical University

基　　金：国家重点研发计划(2016YFC0106903)

摘　　要：目的探索故障树分析法评价磁共振成像设备可靠性研究中的效果,为预防和控制故障的发生,提高设备可靠性提供依据。方法通过专家咨询以及对MRI设备原理和构造的分析建立MRI设备故障树,并利用布尔代数运算法则求MRI设备故障树的全部最小割集和最小路集,最后利用调研收集的国内外不同场强MRI设备的故障数据计算故障事件发生概率,并采用非参数检验分析不同MRI设备故障事件发生率的差别。结果 (1)建立起MRI设备故障树,分析出MRI设备故障树共有32个最小割集,1个最小路集。(2)国产与进口MRI设备之间进行比较,底事件中有6种故障事件发生概率的比较差异有统计学意义(P<0.05);中间事件中有2种故障发生概率比较差异有统计学意义(P<0.05)。(3)场强为3.0T和1.5T的MRI设备的比较,底事件中6种故障事件发生概率的差异有统计学意义(P<0.05)。结论通过故障树分析方法确定引起MRI设备出现故障的最小割集为32个,最小路集为1个,发现了国产与进口MRI设备以及不同场强的MRI设备之间故障事件发生概率的差异,为进一步探究原因、完善改进措施,提高设备可靠性提供依据。ObjectiveTo explore the effectiveness of fault tree analysis in evaluating the reliability of magnetic resonance imaging equipment,and to provide a basis for preventing and controlling the reliability of fault preparedness.MethodsStructure of MRI equipment was built by expert consultation and the analysis of the MRI equipment principle,and all minimum cut set and minimum path set of MRI equipment fault tree was obtained by using Boolean algebra algorithm.Finally,the probability of the occurrence of failure events was calculated by using the failure data collected from different MRI devices at home and abroad,and the difference in the incidence of failure events of different MRI devices was analyzed by non-parametric test.Results(1)The fault tree of MRI equipment was established,and 32 minimum cut sets and 1 minimum path set were analyzed.(2)Domestic MRI equipment was compared with imported MRI equipment,there were statistically significant differences in the probability of 6 failure events in the baseline event(P<0.05).The difference in the probability of two kinds of failure in the intermediate events was statistically significant(P<0.05).(3)MRI equipment with a field intensity of 3.0T compared with MRI equipment with a field intensity of 1.5T,the probability of occurrence of 6 failure events in the baseline event was statistically significant(P<0.05).ConclusionThe fault tree analysis method was used to determine the minimum cut set of 32 and the minimum path set of 1 that caused the failure of MRI equipment.The difference in the probability of occurrence of failure events between domestic and imported MRI equipment and MRI equipment with different field intensities was found,providing a basis for further exploration of the causes,improvement measures and improvement of equipment reliability.

关 键 词：故障树分析法 磁共振成像设备 最小割集 最小路集 

分 类 号：R445.2[医药卫生—影像医学与核医学]