高温材料光谱发射率测量技术研究  

Study of Measurement for High Temperature Spectral Emissivity

作　　者：张俊祺[1] 裴雅鹏[1] 黄赜 王阔传 赵化业[1] 刘浩 ZHANG Jun-qi;PEI Ya-peng;HUANG Ze;WANG Kuo-chuan;ZHAO Hua-ye;LIU Hao(Beijing Aerospace Institute for Metrology and Measurement,Beijing 100076,China)

机构地区：[1]北京航天计量测试技术研究所,北京100076

出　　处：《宇航计测技术》2019年第2期15-19,26,共6页Journal of Astronautic Metrology and Measurement

基　　金：国家重点研发计划资助项目(2017YFF0205200)

摘　　要：针对发射率测量技术现状及面临的问题,明确了建立高温材料光谱发射率测量装置的意义,对所研究的测量装置的技术路线和设计方案进行了介绍。Introduced the present condition and the question for facing carried on introduction,clarifies the significance of establishing the high temperature emissivity measurement standard device,introduced the current research situation,and introduced the technical route and design scheme of the standard device.

关 键 词：高温 光谱发射率 傅立叶红外光谱仪 

分 类 号：TN822[电子电信—信息与通信工程]