一种改进的SRAM故障内建自检测算法  

An Improved SRAM Fault Built-in-self-test Algorithm

作　　者：曾健平[1] 王振宇 袁甲[2] 彭伟[1] 曾云[1] ZENG Jianping;WANG Zhenyu;YUAN Jia;PENG Wei;ZENG Yun(School of Physics and Microelectronics Science,Hunan University,Changsha 410000,China;Institute of Microelectronics,Chinese Academy of Sciences,Beijing 100029,China)

机构地区：[1]湖南大学物理与微电子科学学院,湖南长沙410000 [2]中国科学院微电子研究所,北京100029

出　　处：《湖南大学学报（自然科学版）》2019年第4期97-101,共5页Journal of Hunan University:Natural Sciences

基　　金：国家自然科学基金资助项目(61705065);湖南省自然科学基金资助项目(2017JJ3034);长沙市科技计划项目(kq1804001)~~

摘　　要：面向March C+算法故障覆盖率的问题,本文提出一种改进的March CS算法来完成存储器SRAM的内建自测试.通过增加原算法元素的读写操作来敏化存储单元的故障,检测原算法不能敏化的静态故障和动态故障,从而提高故障覆盖率.最后,通过对1 024*32位静态随机存储器进行故障仿真验证,以及FPGA对SRAM芯片的应用性测试,March CS算法检测静态故障和动态故障的覆盖率分别达到91.67%和76.93%.This paper proposed an improved March CS algorithm to complete the built-in self-test of SRAM memory due to the problem of March C + algorithm’s fault coverage.The static and dynamic fault of memory cell were sensitized by the original algorithm increasing the read-write operation of the algorithm element,so that the fault coverage was enhanced.Finally,the March CS algorithm achievesd 91.67% and 76.93% coverage of static and dynamic faults respectively through the simulation experiments of the 1 024*32-size fault static Randon-Access memory and the measurement of FPGA to SRAM chips.

关 键 词：MARCH CS算法 静态故障 动态故障 故障覆盖率 

分 类 号：TN47[电子电信—微电子学与固体电子学]