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作 者:赵同新 ZHAO Tong-xin(Analytical Applications Center,SHIMADZU(China)Co.,Ltd.,Shanghai 200233,China)
机构地区:[1]岛津企业管理(中国)有限公司分析中心,上海200233
出 处:《电子显微学报》2019年第2期150-155,共6页Journal of Chinese Electron Microscopy Society
摘 要:针对电子探针微区定量分析轻元素及超轻元素的难点进行了总结,结合岛津电子探针EPMA的仪器特点,给出岛津EPMA在测试轻元素及超轻元素方面提供的解决方案和技术优势,并解释了设计的意义所在。以绿柱石和铍方钠石矿物为测试超轻元素Be的实际案例,给出了测试思路和分析方法,并强调了测试过程中的一些注意事项。The problems and difficulties in EPMA quantitative analysis of light and ultra-light elements in the field of microbeam test were summarized. Based on the instrument characteristics,the solutions and technical advantages of Shimadzu EPMA in testing light and ultra-light elements were listed. Moreover,the significances of the design were explained. In this paper,Beryl and tugtupite minerals were used as practical samples to quantitative the ultra-light element Beryllium. The methods of test and analysis were given. The matters needing attention in the testing process were also emphasized.
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