虚实结合的数字集成电路检测装置开发  

Development of Digital Integrated Circuit Detection Device Combining Virtual and Real

作　　者：周灵彬[1] ZHOU Ling-bin(Shaoxing Vocational&Technical College,Shaoxing Zhejiang 312000)

机构地区：[1]绍兴职业技术学院,浙江绍兴312000

出　　处：《数字技术与应用》2019年第3期133-135,共3页Digital Technology & Application

基　　金：浙江省科研项目;名称:基于Labview的数字集成电路检测系统开发研究;项目编号:Y201636774

摘　　要：为节约资源、提高教学中电子元件的重复使用效率,非常有必要对拆卸芯片在重用前进行好坏的检测。利用计算机虚拟仿真技术PROTEUS和LABVIEW进行前期的集成电路检测装置开发,以STC单片机为控制核心设计检测系统,将结果现场显示在液晶上并传输到电脑端的上位机界面进行时序分析。经仿真与实物测试,该装置能有效检测14、16脚TTL和CMOS芯片的好坏。该虚实结合、以软件代替部分硬件的检测装置开发思路不失为一种经济便捷的方法。In order to save resources and improve the efficiency of reuse of electronic components in teaching, it is very necessary to test the disassembled chips before or after reuse. The computer virtual simulation technology PROTEUS and LABVIEW were used to develop the integrated circuit detection device. The STC microcontroller was used as the control core design detection system. The result was displayed on the liquid crystal and transmitted to the host computer interface for timing analysis. Through simulation and physical testing, the device can effectively detect the quality of 14 and 16 TTL and CMOS chips. It is an economical and convenient method to develop the detection device by combining virtual with real and replacing part of hardware with software.

关 键 词：单片机 集成电路检测 虚拟仿真 时序分析 

分 类 号：TN407[电子电信—微电子学与固体电子学]