基于高斯过程的安全攸关系统缺陷定位方法  

Defect Location Method for Safety Critical System Based on Gaussian Process

作　　者：颜培皓 路红[2] YAN Pei-hao;LU Hong(College of Computer & Communication Engineering,China University of Petroleum(East China),Qingdao 266580,China;Zijin College,Nanjing University of Science and Technology,Nanjing 210023,China)

机构地区：[1]中国石油大学(华东)计算机与通信工程学院,山东青岛266580 [2]南京理工大学紫金学院,江苏南京210023

出　　处：《软件导刊》2019年第6期200-203,共4页Software Guide

基　　金：江苏省高等学校自然科学研究面上项目(18KJB520022)

摘　　要：软件缺陷定位的有效性和及时性是提升软件质量的关键因素,现有自动缺陷定位方法和手工调试方法具有一定局限性。为解决这一问题,基于高斯过程的缺陷定位方法和软件自动修复对缺陷定位的有效性评估机制,设计了一种新的面向安全攸关系统的缺陷定位框架。基于ManyBugs和IntroClass设计了软件缺陷定位测试数据集构造方法和实验方案。实验结果表明,该设计方案有效可行。The effectiveness and timeliness of software defect location is a key factor in improving software quality. The existing auto-matic defect location method and manual debugging method have certain limitations in defect location. Based on this,this paper propos-es a method based on Gaussian process for security critical software defect location by combining the Gaussian process-based defect lo-cation method and the automatic evaluation mechanism for the effectiveness of software automatic repair for defect locatio. It analyzes the basic principles and framework design of the method. Finally,based on ManyBugs and IntroClass,the software defect location test data set construction method and experimental scheme are designed. The results show that the design is effective and feasible.

关 键 词：缺陷定位 反调试 反动态跟踪 抗静态分析 高斯过程 

分 类 号：TP309[自动化与计算机技术—计算机系统结构]