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作 者:江柏红[1] 于士章 江玉朗 高晓进[1] 周金帅 JIANG Bai-hong;YU Shi-zhang;JIANG Yu-lang;GAO Xiao-jin;ZHOU Jin-shuai(Research Institute of Aerospace Special Materials and Technology, Beijing 100074, China)
机构地区:[1]航天特种材料及工艺技术研究所
出 处:《核电子学与探测技术》2019年第1期26-30,共5页Nuclear Electronics & Detection Technology
摘 要:针对回转体和扁平体结构的大尺寸C/SiC复合材料构件,设计了可表征缺陷检测分辨率的像质计,研究了射线能量、准直器宽度等因素对不同类型构件检测结果的影响情况。结果表明:射线能最、准直器宽度及构件尺寸、形状等因素决定了构件内部缺陷检测分辨率;准直器的选择取决于构件的尺寸、形状等特征;射线能量的选择取决于构件的最大穿透厚度。Based on the large scale revolved body and flat body made of the C/SiC composite material, a CT image indicator for the C/SiC composite CT results' evaluation was designed and tested, the effect of the X ray energy, the opening of the collimator and other parameters were studied. The result concluded that the CT resolution are determined by the X ray energy, the opening of the collimator, the dimensions and the shape of the samples;the collimator opening are related to the samples' dimensions and the shape;the X ray energy are detennined by the max penetration path of the sample.
关 键 词:C/SIC复合材料 加速器CT 准直器 无损检测
分 类 号:TG115.28[金属学及工艺—物理冶金]
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